A Resilient, Adaptive, Multi-Context Switching, Energy-Efficient Spintronic FPGA (RAMSES-FPGA)
Static random-access memories (SRAM) based FPGAs are susceptible to Single Event Upsets (SEUs). SEUs are transient faults caused by high-energy particles striking the semiconductor material which result in unintended changes in the stored data. This vulnerability is a significant concern specifically in environments with high levels of radiation, such...
Published: 7/28/2025
|
Inventor(s): Abdolah Amirany, Samuel Farid, Hamidreza Imani Porshokouh, Tarek El-Ghazawi
Keywords(s):
Category(s): Technology Classifications > Computers Electronics & Software, Technology Classifications > Computers Electronics & Software > Artificial Intelligence, Technology Classifications > Computers Electronics & Software > Computing Architecture, Technology Classifications > Computers Electronics & Software > Processing Chips
|